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Chalmers University of Technology Adds Imago LEAP Atom Probe to Applied Physics Microscopy and Microanalysis Center
Date: Mon, 08 Sep 2008 12:21:43 GMT
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Chalmers University of Technology Adds Imago LEAP Atom Probe to Applied Physics Microscopy and Microanalysis Center
Trading Markets (press release) - 5 hours ago
Trading Markets (press release) - 5 hours ago
HILLSBORO , Ore . & MADISON , Wis . , Sep 08 , 2008 ( BUSINESS WIRE ) - - FEIC | Quote | Chart | News | PowerRating - - FEI Company ( NASDAQ : FEIC ) and Imago Scientific Instruments jointly ...
Chalmers University of Technology Adds Imago LEAP Atom Probe to Applied Physics Microscopy and Microanalysis Center
Date: Mon, 08 Sep 2008 12:03:49 GMT
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Chalmers University of Technology Adds Imago LEAP Atom Probe to Applied Physics Microscopy and Microanalysis Center
Business Wire (press release) - 5 hours ago
Business Wire (press release) - 5 hours ago
HILLSBORO , Ore . & MADISON , Wis . - - ( BUSINESS WIRE ) - - FEI Company ( NASDAQ : FEIC ) and Imago Scientific Instruments jointly announced today that Chalmers University has installed Imago ...
FEI Launches New X-FEG Electron Source Module
Date: Sat, 06 Sep 2008 05:44:42 GMT
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FEI Launches New X-FEG Electron Source Module
Trading Markets (press release) - Sep 6, 2008
Trading Markets (press release) - Sep 6, 2008
BERKELEY , Calif . , Sep 05 , 2008 ( ASCRIBE NEWS via COMTEX ) - - FEIC | Quote | Chart | News | PowerRating - - FEI Company , a provider of atomic - scale imaging and analysis systems , has ...
FEI releases X-FEG extreme field emission gun
Date: Wed, 03 Sep 2008 16:29:40 GMT
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FEI releases X-FEG extreme field emission gun
Small Times - Sep 3, 2008
Small Times - Sep 3, 2008
September 3 , 2008 : FEI Co . , a provider of atomic - scale imaging and analysis systems , has released its new extreme field emission gun ( X - FEG ) electron source module for the Titan family ...
FEI's New MLA 600F an Important Step Toward Implementing Automated Mineralogy at Operational Sites
Date: Wed, 03 Sep 2008 12:41:49 GMT
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FEI's New MLA 600F an Important Step Toward Implementing Automated Mineralogy at Operational Sites
AZoNano.com - Sep 3, 2008
AZoNano.com - Sep 3, 2008
FEI Company , a leading provider of high - resolution imaging and analysis systems , today released the MLA 600F system , a high - speed automated mineralogy analyzer used in the mining industry ...
Chalmers University of Technology Adds Imago LEAP Atom Probe to Applied Physics Microscopy and Microanalysis Center (Business Wire)
Date: Mon, 8 Sep 2008 12:00:00 Etc/GMT
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HILLSBORO, Ore. & MADISON, Wis.----FEI Company and Imago Scientific Instruments jointly announced today that Chalmers University has installed Imagoâs LEAP® 3000X HR® atom probe in the universityâs Applied Physics Microscopy and Microanalysis facility, based in Göteborg, Sweden.
FEI's New MLA 600F High Speed Automated Mineralogy Analyzer Enables Rapid Optimization of Mineral Processing Operations (Business Wire)
Date: Wed, 3 Sep 2008 12:00:00 Etc/GMT
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FEI's New X-FEG Electron Source Further Extends Lead in Scanning/Transmission Electron Microscope Imaging and Analysis (Business Wire)
Date: Mon, 1 Sep 2008 10:00:00 Etc/GMT
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10 Reasons To Look at 10 Oregon Stocks (at Seeking Alpha)
Date: Mon, 18 Aug 2008 21:40:28 Etc/GMT
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FEI Company Announces Webcast of Oregon Technology Investors Tour Meeting on August 12 (Business Wire)
Date: Mon, 11 Aug 2008 10:00:00 Etc/GMT
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